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Third generation

Semiconductor Testing

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Third generation semiconductor testing family
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KGD handler



Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model KGD handler
Product introduction Fully automatic testing, supporting SiC wafer, Waffle Pack, Tape&Reel loading and unloading.
Features ? Multi-station parallel testing, different stations support different temperatures and test items.
? Static, dynamic, avalanche function testing, and the test sequence is adjustable.
? High temperature preheating and chip surface anti-oxidation protection.
? High temperature test, temperature range: room temperature~200°C.
? The power-on pin card is sealed and supports nitrogen filling to protect against high-pressure sparks and nitrogen pressure monitoring.